№ files_lp_4_process_1_39686
Year: 2025
Location: TÜV Rheinland North America, Technology and Innovation Center, Boxborough, MA, USA
Event Type: Technical Meeting / Presentation
Organizers: IEEE EMC Boston Chapter, TÜV Rheinland North America
Speakers: Art Wall, Zhong Chen, Nicholas Abbondante, Bob Mitchell
Topics: History of ANSI C63.4, EMC emissions measurement techniques, antenna tilting, live demonstration of scanning methods
Audience: IEEE members and guests
Registration Deadline: April 30, 2025
Schedule: 5:00 pm registration and dinner, 6:00 pm presentations, 8:30 pm adjourn
Parking: Complimentary
Context: Conference material detailing technical presentations, speaker biographies, and live demonstrations on electromagnetic compatibility measurements and ANSI C63.4 standard developments.
Price: 8 / 10 USD
The file will be delivered to the email address provided at checkout within 12 hours.

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